IEEE VLSI Test Symposium

2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings  Yashwant K. Malaiya Manoj Sachdev Sankaran M. Menon IEEE INTERNATIONAL WORKSHOP ON DEFECT BA IEEE VLSI TEST SYMPOSIUM Paperback. Institute of Electrical & Electronics Enginee, 2000-08-22 ISBN 9780769506371     17th IEEE Vlsi Test Symposium: April 25-29, 1999 Dana Point, California : Proceedings (Ieee Vlsi Test Symposium)  IEEE VLSI Test Symposium Paperback. Institute of Electrical & Electronics Enginee, 1999-04-23 ISBN 9780769501468     1996 IEEE Vlsi Test Symposium: April 28-May 1, 1996 Princeton, New Jersey  IEEE VLSI Test Symposium Paperback. Institute of Electrical & Electronics Enginee, 1996-04 ISBN 9780818673047